Cable harness test probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. Their standard and requirements are higher than other series of test probes. They can be divided into screw-thread harness test probes, cable harness switch probes, non-screw-thread harness test probes, position-limited harness test probes and cable harness high-current probes, etc.

High-current probes can withstand high current and high temperature in the tests. They are mainly applied to the in-circuit test field of high temperature and high current environments.

High-current probes manufactured by Centalic mainly include P203, P264, P265, P350 and P420, etc. There is a fixed schedule for mass production of P420-HP-19G(C). This probe can withstand the current up to 20 Amps. And its typical maximum contact resistance is 20 milliohms.

The materials used for the construction of this high-current test probe are different for each component:
The barrel is made of brass. Subsequently gold and nickel plated during the galvanic plating phase.
The spring is made of gold plated music wire.
The plunger is made of SK4, then gold and nickel plated.
The plunger tip is made of brass, then gold and nickel plated.

For details, please check parameters in below table.
Technical Specifications

For more information, please check below catalog.

Company Information:

Centalic Technology Development Ltd. was founded in 1980. Specializing in R&D, manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment.

Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.
 
Our company owns professional R&D, production, sales teams under the working principle of 'quality, punctuality, confidentiality' to totally efficiently develop test probes in accordance with the requirements of customers' test projects and meet the needs of customers for mass production as well as developing markets. With many years' continuous endeavour of our staff, Centalic has built a solid foundation in this industry and our products have been sold all over the world. 
 
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